Berkeley ELENG 105 - Report 2 Electronic Test Equipment (2 pages)

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Report 2 Electronic Test Equipment



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Report 2 Electronic Test Equipment

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Pages:
2
School:
University of California, Berkeley
Course:
Eleng 105 - Microelectronic Devices and Circuits
Microelectronic Devices and Circuits Documents

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UNIVERSITY OF CALIFORNIA AT BERKELEY College of Engineering Department of Electrical Engineering and Computer Sciences EE105 Lab Experiments Report 2 Electronic Test Equipment Name Lab Section 3 1 1 Record the error in the power supply at 1 V 5 V and 9 V Voltage Setting 1V 5V 9V DMM Measurement Error 3 1 2 What is the error in percent What is another error factor that may cause deviation from the ideal 3 1 3 Why are you not supposed to connect the DMM in current mode to the terminals of a voltage source 3 1 4 Measure the current and compare the value to your hand calculation 3 2 1 What is the error on the function generator output at 1 kHz 1 Vp p after taking the voltage division factor into account 3 2 2 What is the highest frequency sinusoid that the generator can produce What is the error in the panel according to the oscilloscope 1 2 3 2 3 What is the smallest Vp p that the function generator can produce What is the error Without averaging does the oscilloscope over measure or under measure the Vp p value circle one 3 2 4 What is the shortest pulse that the function generator can produce at 500 mV height 3 2 7 Calculate the value of vvos at 1 kHz from your oscilloscope measurements 3 3 1 Attach the printed plot of the 100 I V characteristic 3 3 2 Attach the printed plot of the diode I V characteristic 3 3 3 What is the VO value calculated from your load line Does it match the value measured with the DMM



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