Berkeley ELENG 105 - Lecture 38: Frequency response (15 pages)

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Lecture 38: Frequency response



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Lecture 38: Frequency response

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Pages:
15
School:
University of California, Berkeley
Course:
Eleng 105 - Microelectronic Devices and Circuits
Microelectronic Devices and Circuits Documents

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EECS 105 Spring 2004 Lecture 38 Lecture 38 Frequency response Prof J S Smith Department of EECS University of California Berkeley EECS 105 Spring 2004 Lecture 38 Prof J S Smith Context Next week is the last week of lecture and we will spend those three lectures reviewing the material of the course and looking at applications of the material Today and Friday we will look at a device matching and then the basics of differential amplifiers Department of EECS University of California Berkeley 1 EECS 105 Spring 2004 Lecture 38 Prof J S Smith Reading z Chapter 10 Frequency analysis of active circuits Department of EECS University of California Berkeley EECS 105 Spring 2004 Lecture 38 Prof J S Smith Lecture Outline z z Department of EECS Device matching in current mirrors Introduction to differential amplifiers University of California Berkeley 2 EECS 105 Spring 2004 Lecture 38 Prof J S Smith Device Matching z One of the things that we depend on in the design of analog integrated circuits is device matching For example if we make a current mirror we are depending on the reference and the mirror device behaving is a very similar fashion When a gatesource voltage is developed on the reference device passing a given current the same voltage appearing across the gate to source on the mirror device will allow the same drain current Department of EECS University of California Berkeley EECS 105 Spring 2004 Lecture 38 Prof J S Smith Variations The transistors will generally vary due to several causes z Temperature very similar for devices on the same substrate z Implant variations important for small devices z Variations in width important for narrow devices z Variations in length important for short channel devices z Layout variations Often analog devices will not be minimum sized devices so that output resistances will be lower short channel effects will be smaller and the effect of variations is reduced z Department of EECS University of California Berkeley 3 EECS 105 Spring



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