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Duke ECE 269 - Lecture 1: Overview

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1 ECE 269 Krish Chakrabarty 1 ECE 269 VLSI System Testing Krish Chakrabarty Lecture 1: Overview ECE 269 Krish Chakrabarty 2 Lecture 1 Introduction • VLSI realization process • Verification and test • Ideal and real tests • Costs of testing • Roles of testing • A modern VLSI device - system-on-a-chip • Course outline – Part I: Introduction to testing – Part II: Test methods – Part III: Design for testability Class website: people.ee.duke.edu/~krish/teaching/269.html2 ECE 269 Krish Chakrabarty 3 HW #0 – Due Friday Jan 13, 5 pm • Goal: to make me familiar with your background – Submit (e-mail me) a 1-page document that has background information about you: • Your name • Educational background (e.g. “B.S. in EE from Duke”) • Technical work background (e.g. “I worked at Company C designing ICs”) • Which research group at Duke are affiliated with, if any? What is your research on? • Have you ever (and briefly describe your yes/no answers): – Taken the following courses at undergrad level: circuits, devices, architecture, VLSI design? – Used CAD tools for circuit/chip design? – Worked on complex software development projects? • Why are you taking this course? ECE 269 Krish Chakrabarty 4 International Technology Roadmap for Semiconductors http://public.itrs.net/Files/2003ITRS/Home2003.htm (2009 edition now available, http://public.itrs.net/) Test costManufacturingcost3 ECE 269 Krish Chakrabarty 5 VLSI Realization Process Determine requirements Write specifications Design synthesis and Verification Fabrication Manufacturing test Chips to customer Customer’s need Test development ECE 269 Krish Chakrabarty 6 Definitions • Design synthesis: Given an I/O function, develop a procedure to manufacture a device using known materials and processes. • Verification: Predictive analysis to ensure that the synthesized design, when manufactured, will perform the given I/O function. • Test: A manufacturing step that ensures that the physical device, manufactured from the synthesized design, has no manufacturing defect.4 ECE 269 Krish Chakrabarty 7 Verification vs. Test • Verifies correctness of design. • Performed by simulation, hardware emulation, or formal methods. • Performed once prior to manufacturing. • Responsible for quality of design. • Verifies correctness of manufactured hardware. • Two-part process: – 1. Test generation: software process executed once during design – 2. Test application: electrical tests applied to hardware • Test application performed on every manufactured device. • Responsible for quality of devices. ECE 269 Krish Chakrabarty 8 Problems of Ideal Tests • Ideal tests detect all defects produced in the manufacturing process. • Ideal tests pass all functionally good devices. • Very large numbers and varieties of possible defects need to be tested. • Difficult to generate tests for some real defects. Defect-oriented testing is an open problem.5 ECE 269 Krish Chakrabarty 9 Real Tests • Based on analyzable fault models, which may not map on real defects. • Incomplete coverage of modeled faults due to high complexity. • Some good chips are rejected. The fraction (or percentage) of such chips is called the yield loss. • Some bad chips pass tests. The fraction (or percentage) of bad chips among all passing chips is called the defect level. ECE 269 Krish Chakrabarty 10 Testing as a Filter Process Fabricated chips Good chips Defective chips Prob(good) = y Prob(bad) = 1- y Prob(pass test) = high Prob(fail test) = high Prob(fail test) = low Prob(pass test) = low Mostly good chips Mostly bad chips6 ECE 269 Krish Chakrabarty 11 Costs of Testing • Design for testability (DFT) – Chip area overhead and yield reduction – Performance overhead • Software processes of test – Test generation and fault simulation – Test programming and debugging • Manufacturing test – Automatic test equipment (ATE) capital cost – Test center operational cost ECE 269 Krish Chakrabarty 12 Cost of Test • “The emergence of more advanced ICs and SOC semiconductor devices is causing test costs to escalate to as much as 50 percent of the total manufacturing cost.” – M. Kondrat, “Bridging design and ATE cuts test cost - Test & Measurement - automatic test equipment”, Electronic News, Sept 9, 2002. • “As a result, semiconductor test cost continues to increase in spite of the introduction of DFT, and can account for up to 25-50% of total manufacturing cost”. – T. Cooper, G. Flynn, G. Ganesan, R. Nolan, C. Tran, Motorola, “Demonstration and Deployment of a Test Cost Reduction Strategy Using Design-for-Test (DFT) and Wafer Level Burn-In and Test”, (6/29/2001) Future Fab Intl. Volume 11. • “Test may account for more than 70% of the total manufacturing cost - test cost does not directly scale with transistor count, dies size, device pin count, or process technology”, ITRS 2003.7 ECE 269 Krish Chakrabarty 13 Motivation: XBox 360 Technical Problems • The "Red Ring of Death": Three red lights on the Xbox 360 indicator, representing "general hardware failure” (http://en.wikipedia.org/wiki/3_Red_Lights_of_Death) • The Xbox 360 can be subject to a number of possible technical problems. Since the Xbox 360 console was released in 2005 the console gained reputation in the press in articles portraying poor reliability and relatively high failure rates. • On 5 July 2007, Peter Moore (Corporate Vice President of the Interactive Entertainment Business in the Entertainment and Devices Division at Microsoft, until August 2007) published an open letter recognizing the problem and announcing 3 years warranty expansion for every Xbox 360 console that experiences the general hardware failure indicated by the three flashing red lights on the console. ECE 269 Krish Chakrabarty 14 XBox 360 Technical Problems (Contd.) • July 5, 2007, Xbox issues to cost Microsoft $1 billion-plus. Unacceptable number of repairs leads to company extending warranties. • Matt Rosoff, an analyst at the independent research group Directions on Microsoft, estimates that Microsoft’s entertainment and devices division has lost more than $6 billion since 2002.8 ECE 269 Krish


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