UCD EEC 116 - ELECTROMIGRATION - D802535

Home> Schools> University of California, Davis> Engineering Electrical & Compu (EEC) (EEC) > EEC 116> ELECTROMIGRATION

DOC PREVIEW

UCD EEC 116 - ELECTROMIGRATION

School name University of California, Davis

Course Eec 116- Circuits II

Pages 3

This preview shows page 1 out of 3 pages.

Save

View full document

Premium Document

Do you want full access? Go Premium and unlock all 3 pages.

Access to all documents

Download any document

Ad free experience

Subscribe for instant access Get instant access

Premium Document

Do you want full access? Go Premium and unlock all 3 pages.

Access to all documents

Download any document

Ad free experience

Subscribe for instant access Get instant access

Unformatted text preview:

1ELECTROMIGRATIONEEC116,Spring2008, B.Baas2ElectromigrationLimits dc-current to 1 mA/μm• OpenwirefailureSource: Digital Integrated Circuits, 2nd ©2EEC116,Spring2008, B.Baas3Electromigration• OpencontactplugfailureSource: Digital Integrated Circuits, 2nd ©EEC116,Spring2008, B.Baas4Electromigration• Hillockformation•ShortcircuitfailureSource: CSL, METU3EEC116,Spring2008, B.Baas5Electromigration• HillocksformedinaCulineduringelectro‐migrationtestSource: Notre

View Full Document

UCD EEC 116 - ELECTROMIGRATION

Sign up for free to view:

This document and 3 million+ documents and flashcards
High quality study guides, lecture notes, practice exams
Course Packets handpicked by editors offering a comprehensive review of your courses
Better Grades Guaranteed


School:
Email:
New Password:
Confirm Password:

This preview shows page 1 out of 3 pages.

UCD EEC 116 - ELECTROMIGRATION

Sign up for free to view:

Please select your school