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USC EE 459Lx - CA3338

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1®CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.1-888-INTERSIL or 321-724-7143| Intersil (and design) is a registered trademark of Intersil Americas Inc.Copyright © Intersil Americas Inc. 2003. All Rights ReservedAll other trademarks mentioned are the property of their respective owners.CMOS Video Speed, 8-Bit, 50 MSPS, R2R D/A ConvertersThe CA3338 family are CMOS/SOS high speed R2R voltage output digital-to-analog converters. They can operate from a single +5V supply, at video speeds, and can produce “rail-to-rail” output swings. Internal level shifters and a pin for an optional second supply provide for an output range below digital ground. The data complement control allows the inversion of input data while the latch enable control provides either feedthrough or latched operation. Both ends of the R2R ladder network are available externally and may be modulated for gain or offset adjustments. In addition, “glitch” energy has been kept very low by segmenting and thermometer encoding of the upper 3 bits.The CA3338 is manufactured on a sapphire substrate to give low dynamic power dissipation, low output capacitance, and inherent latch-up resistance.Ordering InformationFeatures• CMOS/SOS Low Power• R2R Output, Segmented for Low “Glitch”• CMOS/TTL Compatible Inputs• Fast Settling: (Typ) to 1/2 LSB . . . . . . . . . . . . . . . . . . 20ns• Feedthrough Latch for Clocked or Unclocked Use• Accuracy (Typ). . . . . . . . . . . . . . . . . . . . . . . . . . ±0.5 LSB• Data Complement Control• High Update Rate (Typ) . . . . . . . . . . . . . . . . . . . . . 50MHz• Unipolar or Bipolar OperationApplications• TV/Video Display• High Speed Oscilloscope Display• Digital Waveform Generator• Direct Digital SynthesisPinoutCA3338, CA3338A(PDIP, SOIC)TOP VIEWPART NUMBERLINEARITY (INL, DNL)TEMP. RANGE (oC) PACKAGEPKG. NO.CA3338E ±1.0 LSB -40 to 85 16 Ld PDIP E16.3CA3338AE ±0.75 LSB -40 to 85 16 Ld PDIP E16.3CA3338M ±1.0 LSB -40 to 85 16 Ld SOIC M16.3CA3338AM ±0.75 LSB -40 to 85 16 Ld SOIC M16.314151691312111012345768D7D6D5D4D3D2VSSD1VDDCOMPVREF+VOUTVREF-VEED0LEFN1850.3CA3338, CA3338AData Sheet May 20032Functional DiagramCOMPTO 7-LINEVDDD7D6D5D4D3D2D1D0VSS161514123456798THERMOMETERENCODER3-BITLEVELSHIFTERSFEEDTHROUGHLATCHES8R4R2R2R2R2R2R2R8R8R8R4R1310VEEVREF-VOUTVREF+12112RRRRLER ≅ 160ΩRRRRCA3338, CA3338ACA3338, CA3338A3CA3338, CA3338AAbsolute Maximum Ratings Thermal InformationDC Supply-Voltage Range. . . . . . . . . . . . . . . . . . . . . . .-0.5V to +8V(VDD - VSS or VDD - VEE, Whichever is Greater)Input Voltage RangeDigital Inputs (LE, COMP D0 - D7). . . . VSS - 0.5V to VDD + 0.5VAnalog Pins (VREF+, VREF-, VOUT) . . . .VDD - 8V to VDD + 0.5VDC Input CurrentDigital Inputs (LE, COMP, D0 - D7) . . . . . . . . . . . . . . . . . . ±20mARecommended Supply Voltage Range . . . . . . . . . . . . . 4.5V to 7.5VOperating ConditionsTemperature Range (TA)Plastic Package, E suffix, M suffix . . . . . . . . . . . . . . -40oC to 85oCThermal Resistance (Typical, Note 1) θJA (oC/W) θJC (oC/W)PDIP Package . . . . . . . . . . . . . . . . . . . 90 N/ASOIC Package . . . . . . . . . . . . . . . . . . . 100 N/AMaximum Junction TemperaturePlastic Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150oCMaximum Storage Temperature Range, TSTG . . . . -65oC to 150oCMaximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC(SOIC - Lead Tips Only)CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of thedevice at these or any other conditions above those indicated in the operational sections of this specification is not implied.NOTE:1. θJA is measured with the component mounted on an evaluation PC board in free air.Electrical Specifications TA = 25oC, VDD = 5V, VREF+ = 4.608V, VSS = VEE = VREF- = GND, LE Clocked at 20MHz, RL ≥ 1 MΩ,Unless Otherwise SpecifiedPARAMETER TEST CONDITIONS MIN TYP MAX UNITSACCURACYResolution 8 - - BitsIntegral Linearity Error See Figure 4CA3338 - - ±1LSBCA3338A - - ±0.75 LSBDifferential Linearity Error See Figure 4CA3338 - - ±0.75 LSBCA3338A - - ±0.5 LSBGain Error Input Code = FFHEX, See Figure 3CA3338 - - ±0.75 LSBCA3338A - - ±0.5 LSBOffset Error Input Code = 00HEX; See Figure 3 - - ±0.25 LSBDIGITAL INPUT TIMINGUpdate Rate To Maintain 1/2 LSB Settling DC 50 - MHzUpdate Rate VREF- = VEE = -2.5V, VREF+ = +2.5V DC 20 - MHzSet Up Time tSU1For Low Glitch - -2 - nsSet Up Time tSU2For Data Store - 8 - nsHold Time tHFor Data Store - 5 - nsLatch Pulse Width tWFor Data Store - 5 - nsLatch Pulse Width tWVREF- = VEE = -2.5V, VREF+ = +2.5V - 25 - nsOUTPUT PARAMETERS RL Adjusted for 1VP-P OutputOutput Delay tD1From LE Edge - 25 - nsOutput Delay tD2From Data Changing - 22 - nsRise Time tr10% to 90% of Output - 4 - nsSettling Time tS10% to Settling to 1/2 LSB - 20 - nsOutput Impedance VREF+ = 6V, VDD = 6V 120 160 200 ΩGlitch Area - 150 - pV/sGlitch Area VREF- = VEE = -2.5V,VREF+ = +2.5V - 250 - pV/s4CA3338, CA3338AREFERENCE VOLTAGEVREF+ Range (+) Full Scale, Note 2 VREF- + 3 - VDDVVREF- Range (-) Full Scale, Note 2 VEE -VREF+ - 3 VVREF+ Input Current VREF+ = 6V, VDD = 6V - 40 50 mASUPPLY VOLTAGEStatic IDD or IEELE = Low, D0 - D7 = High - 100 220 µALE = Low, D0 - D7 = Low - - 100 µADynamic IDD or IEEVOUT = 10MHz, 0V to 5V Square Wave - 20 - mADynamic IDD or IEEVOUT = 10MHz, ±2.5V Square Wave - 25 - mAVDD Rejection 50kHz Sine Wave Applied - 3 - mV/VVEE Rejection 50kHz Sine Wave Applied - 1 - mV/VDIGITAL INPUTS D0 - D7, LE, COMPHigh Level Input Voltage Note 2 2 - - VLow Level Input Voltage Note 2 - - 0.8 VLeakage Current - ±1 ±5 µACapacitance - 5 - pFTEMPERATURE COEFFICIENTSOutput Impedance - 200 - ppm/×oCNOTE:2. Parameter not tested. but guaranteed by design or characterization.Electrical Specifications TA = 25oC, VDD = 5V, VREF+ = 4.608V, VSS = VEE = VREF- = GND, LE Clocked at 20MHz, RL ≥ 1 MΩ,Unless Otherwise Specified (Continued)PARAMETER TEST CONDITIONS MIN TYP MAX UNITS5CA3338, CA3338ADigital Signal PathThe digital inputs (LE, COMP, and D0 - D7) are of TTL compatible HCT High Speed CMOS design: the loading is essentially capacitive and the logic threshold is typically 1.5V.The 8 data bits, D0 (weighted 20) through D7 (weighted 27), are applied to Exclusive OR gates (see Functional Diagram). The COMP (data complement) control provides


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USC EE 459Lx - CA3338

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