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MIT 6 003 - Test Procedure in Thermal/Vacuum

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32-06003.0201 Page 1 of 12 Revision 03 Rev. ECO Description Author Approved Date 01 32-248 Use for SN2 Thermal-Vacuum testing RFGoeke 9/27/07 02 32-249 Adjustments based upon use RFGoeke 9/29/07 03 32-250 Add reset of cal rate at end RFGoeke 10/1/07 CRaTER Short Form Functional Test Procedure in Thermal/Vacuum Dwg. No. 32-06003.0201 Revision 03 October 1, 2007 Serial No _________ Date: ___________32-06003.0201 Page 2 of 12 Revision 03 Table of ContentsPREFACE.............................................................................................................3 1 INTRODUCTION.............................................................................................4 2 REQUIREMENTS ...........................................................................................5 3 CONFIGURATION..........................................................................................6 4 PROCEDURES ...............................................................................................7 4.1 Identification of Test Environment .........................................................................................7 4.2 Identification of Equipment and Personnel ...........................................................................7 4.3 Configure the EGSE ..................................................................................................................8 4.4 Verify Initial Instrument State ................................................................................................8 4.5 Turn Detector Bias On ............................................................................................................10 4.6 Initiate the Internal Calibration Signal ................................................................................11 4.7 Check Detector Noise Levels ..................................................................................................1132-06003.0201 Page 3 of 12 Revision 03 Preface Revision 01 of the parent Rev. B is tuned for use during Thermal-Vacuum testing to account for a) the lack of PRT feedback into the instrument telemetry stream; and b) the presence of a 60Co source permanently sitting on top of the telescope. Revision 02 allowed for variations which occurred at -40C. The dosimeter output is drifting by a bit or so and it is collecting a few counts from the 60Co source, the singles counts are not well behaved (decided to ignore those altogether), and the noise statistics are getting worse. Revision 03 reset the cal rate to 8Hz at the end of the procedure.32-06003.0201 Page 4 of 12 Revision 03 1 Introduction Same as parent document.32-06003.0201 Page 5 of 12 Revision 03 2 Requirements Same as parent document.32-06003.0201 Page 6 of 12 Revision 03 3 Configuration Same as parent document.32-06003.0201 Page 7 of 12 Revision 03 4 Procedures Space is provided for the recording of information of particular significance in the conduct of this test. Where a value simply needs to be verified, as opposed to recorded – or an instruction to send a command acknowledge -- a simple check mark √ will suffice. In addition the Test Conductor may redline the procedure to more accurately document the actual flow of events, both routine and anomalous. The pages of this section will be attached to the Test Report that is filed each time this activity is conducted. The telemetry data stream generated by the spacecraft simulator is also an integral part of the Test Report; that data is archived on crater.bu.edu. 4.1 Identification of Test Environment Procedure requiring this test: ______________________________________ ______________________________________ Location of Test Environment ______________________________________ Date: ______________________________________ 4.2 Identification of Equipment and Personnel Flight Instrument, 32-10000 S/N ____________ Spacecraft Simulator, 32-80201 S/N _____________ Test Conductor _______________________________ QA Representative: _______________________________ Other Individuals: _______________________________ _______________________________ _______________________________ _______________________________32-06003.0201 Page 8 of 12 Revision 03 4.3 Configure the EGSE We assume that “sf_log” and “sf_noise” as well as CHouse and CCmd are running on the test console. If not, refer to the parent Short Form Functional for instructions. 4.4 Verify Initial Instrument State Turn on DC power supply and verify proper instrument initialization as follows – or, if the instrument is already powered issue the following command: Verify that the time displayed in either the “CRaTER Analog House” and “CRaTER Command” widows is consistent with wall time and is incrementing every second. Time and Date displayed Initial Verify that the time string displayed is not preceded by “/One Hertz/”, which would indicate a failure of the instrument to receive the 1 Hz tick from the spacecraft simulator on J1. Check absence of /One Hertz/ display Initial Record the serial number of the unit under test, as displayed at CRaTER Command window. Instrument Serial Number Initial Read, record, and verify the state of the instrument command tell-tales (the current state is highlighted in the display. From command.tcl Group Command Value Expected OK? HV Bias On/Off Off Low Off High Off Calibrate Rate 8 Hz D1 On D2 On D3 On D4 On D5 On Processing D6 On Function Value Sent? Command Reset n/a32-06003.0201 Page 9 of 12 Revision 03 Read, record, and verify the nominal housekeeping values recorded by the instrument. Note that the PRT is read out with an ohmmeter. From house.tcl Group Measurement Value Units Expected OK? 28VDC Bus 21-35 +5 Digital 5.0±0.1 +5 Analog 5.0±0.1 Bus Voltages -5 Analog volts -5.0±0.1 Total Power 28VDC Bus Watts 5-8 D1 D3 D5 <0.1 D2 D4 Bias Current D6 µamps <0.40 at 25C Thin 2.5±1 Bias Voltage Thick volts 2.5±1 Cal Amplitude <0.01 Thin LLD 0.048±0.001 Thresholds Thick LLD volts 0.048±0.001 Telescope Ambient Analog Board Ambient Digital Board Ambient DC-DC Supply Ambient Temperatures Bulkhead C Ambient Ground Test PRT Temp. ohms


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MIT 6 003 - Test Procedure in Thermal/Vacuum

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