New version page

UT Tyler EENG 3302 - Lab #1 Report

This preview shows page 1-2-3 out of 8 pages.

View Full Document
View Full Document

End of preview. Want to read all 8 pages?

Upload your study docs or become a GradeBuddy member to access this document.

View Full Document
Unformatted text preview:

Lab 1 – Digital Systems: Instruments Laboratory Report for EENG 3302 College of Engineering and Computer Science Department of Electrical Engineering University of Texas at Tyler Tyler, TX Lab Partners ABSTRACT The intent of this lab is to become familiar with the instruments that will be used through out the Digital Systems course to include Oscilloscope, Function Generator, BreadboardLab 1 – Digital Systems: Instruments 1 and the 7400 NAND gate. The lab #1 instructions were used to learn the functions of the listed instruments and perform tests on a NAND gate circuit. I. PROJECT DESCRIPTION This purpose of this experiment was to utilize an oscilloscope to measure the frequency and periods of different waveforms. A NAND gate circuit was created and the peak to peak voltages measured using the built-in function generator on the oscilloscope. II. THEORETICAL BACKGROUND Using the equation [ Frequency = 1/Period ] as well as the NAND truth table as verification, the oscilloscope will confirm the calculations of Ohm’s Law and the NAND truth table will confirm the operation of the NAND gate as an inverting operational amplifier. III. METHODS AND MATERIALS Equipment Instrument Function Oscilloscope - Agilent Technologies MSO-X-2002A Display and analyze the waveform Function Generator Agilent Technologies MSO-X-2002A Built-in on oscilloscope generate sine, square and triangular AC function signals BNC Cables Connect the oscilloscope to the input signal Channel Probes Measure for voltage or current across a component within the circuit. Breadboard Twin Industries TW-E41-1060 Allow for the construction of the circuit 7400 NAND Gate Produces a false/inverting output signal Experimental procedure The laboratory procedure was conducted in accordance with EE 3302 Lab-1 Digital Systems: Instruments written by the Electrical Engineering Department at UT Tyler.Lab 1 – Digital Systems: Instruments 2 1. Generate a sine wave of 1 kHz and 500 mV and calculate for the period and frequency by first disconnecting all probes, and connecting the 50 ohm coaxial cable into channel 1 input. The front panel key WaveGen should be selected and then under settings the default WaveGen soft key provides an image of the waveform when pressed. 2. Become familiar with the Frequency, Amplitude, and Offset soft keys by using the Entry knob in order to increase or decrease the values. Use the Waveform soft key to change the type of wave displayed from a sinusoidal wave to a square, triangular, or ramp waveform. Note that the Duty Cycle may be tuned when the Square waveform is selected, and the pulse width may be tuned when the Pulse is selected. 3. The Cursors function help measure the graphed waveform. Using the cursors knob, the X1 and X2 lines can be scaled to each peak to measure the amplitude of the wave, and the Y1 and Y2 lines can be scaled to measure for the period. 4. By following these steps the student should be able to generate a sine, square, and triangular wave at 1kHz and 33kHz for each waveform. There should be 6 different graphs total, and using the oscilloscope the voltage and amplitude of each wave may be measured. Using the period of each wave, the frequency should be confirmed. 5. By wiring a NAND gate on a 7400 integrated circuit using a breadboard, the boolean logic from a truth table is confirmed. Draw this table and confirm results. IV. RESULTS Evaluating the 1kHz frequency sinusoidal waveform from the graph on the oscilloscope the period was identified to be 0.001 seconds. The amplitude was 340mV, and the voltage was determined to be 680mV. Waveform Units Unit Size Amplitude Voltage Units Unit Size Period Frequency Sine 1.7 200mV 340mV 680mV 2 500µ 0.001s 1kHz Square 1.7 200mV 340mV 680mV 2 500µ 0.001s 1kHz Triangle 1.7 200mV 340mV 680mV 2 500µ 0.001s 1kHz Sine 3.4 100mV 340mV 680mV 3 10µ 30µs 33kHz Square 3.4 100mV 340mV 680mV 3 10µ 30µs 33kHz Triangle 3.4 100mV 340mV 680mV 3 10µ 30µs 33kHzLab 1 – Digital Systems: Instruments 3 (1 kHz Sine Wave) (33 kHz Sine Wave)Lab 1 – Digital Systems: Instruments 4 (1 kHz Square Wave) (33 kHz Square Wave)Lab 1 – Digital Systems: Instruments 5 (1 kHz Sine Wave with Set Triggers) (1 kHz Sine Wave with Auto Triggering)Lab 1 – Digital Systems: Instruments 6 (1 kHz Triangle Wave) (33 kHz Triangle Wave)Lab 1 – Digital Systems: Instruments 7 V. DISCUSSION The resulting values for the amplitude are in line with the theory of wavelength division counting such that the product of the units and unit size is found to be the amplitude and similarly, the product of the units and unit size in the x direction was found to be the period of the wave. This is true for each waveform. When the frequency was changed from 1kHz to 33kHz the amplitude and the period also changed. This is due to the relationship that the frequency of a wave determines the value for the period [ Frequency = 1/Period ]. Constructing the NAND gate circuit verified the values of the truth table provided in the Theoretical Background section. VI. CONCLUSIONS In summary, as the frequency wave is altered, the period should produce the inverse of the frequency as verified by our results. By re-creating these varying waves and building the logic gate in a circuit the functions and uses of an oscilloscope, function generator, and various other laboratory instruments were understood and our experiment was successful. Looking at the TTL Cookbook we can see that our NAND gate version is that of a 2-input NAND. Upon utilizing the Multisim Digital Software and following the tutorial instructions, it is verified that the same circuitry using the 7400 NAND gate can be created and tested. VII. REFERENCES Lab 1 – Digital Systems: Instruments - EENG 3302, College of Engineering and Computer Science, Department of Electrical Engineering, University of Texas at


View Full Document
Loading Unlocking...
Login

Join to view Lab #1 Report and access 3M+ class-specific study document.

or
We will never post anything without your permission.
Don't have an account?
Sign Up

Join to view Lab #1 Report and access 3M+ class-specific study document.

or

By creating an account you agree to our Privacy Policy and Terms Of Use

Already a member?