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Other Devices Junction FET (JFET) Metal-Semiconductor FET (MESFET)High Electron Mobility TransistorSolid State Memory Flash (EEPROM) MemoryShort Channel EffectsHOT Electrons and Lightly Doped Drain (LDD) The electric field near drain is too high to generate “hot” electrons, which can generate substrate current, gate currents and (worse yet) trapped electrons in the gate oxide. LDD can reduce the drain-side electric field and mitigate “hot” electron problems.State-of-the-art CMOS on SOI Example: Detailed p-strained
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